1

Wafer level backside emission microscopy: dynamics and effects

Year:
1999
Language:
english
File:
PDF, 247 KB
english, 1999
2

Wafer level backside emission microscopy: sample preparation

Year:
1999
Language:
english
File:
PDF, 173 KB
english, 1999
3

On the theoretical basis of the surface photovoltage technique

Year:
1985
Language:
english
File:
PDF, 521 KB
english, 1985
5

Electron diffusion lengths in Mn-doped InP

Year:
1983
Language:
english
File:
PDF, 270 KB
english, 1983